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"可镁科学讲坛”第十四期:(2016年11月17日)Application of in situ XAFS Analysis to Study of Catalysts and PL Devices

报告题目:Application of in situ XAFS Analysis to Study of Catalysts and PL Devices

报告人:Kyoko K. Bando(National Institute of Advanced Industrial Science and Technology, Japan)

报告时间:20161117日(星期四)上午9点半

报告地点:旗山校区文4二楼外语学院会议厅(院办走廊尽头左拐

 

报告摘要XAFS (X-ray absorption Fine Structure) is a very useful tool for structural analysis of catalysts. It is possible to analyze structure of nanoparticles which are thought to be active sites on the catalysts. In addition to that, the high transmittance of X-ray through materials composed of light elements enables observation of active sites under reaction conditions. In this talk, our previous work which was conducted by in situ XAFS will be presented. They are going to be about Rh catalysts under CO2 hydrogenation condition, Pd-Pt catalysts during model hydrodearomatization conditions, and Ni2P catalysts under hydrodesurfization conditions. The work on Ni2P employed a combined in situ XAFS and FTIR analysis. Finally, our recent work on combined analysis of photoluminescent devices with a combined in situ XAFS and XRD will be presented.

报告人简介

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